New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure
- 1 November 1971
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 27 (18), 1204-1207
- https://doi.org/10.1103/physrevlett.27.1204
Abstract
We have applied Fourier analysis to our point-scattering theory of x-ray absorption fine structure to invert experimental data formally into a radial structure function with determinable structural parameters of distance from the absorbing atom, number of atoms, and widths of coordination shells. The technique is illustrated with a comparison of evaporated and crystalline Ge. We find that the first and second neighbors in amorphous Ge are at the crystalline distance within the accuracy of measurement (1%).Keywords
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