A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices
- 1 March 2011
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 82 (3), 034702
- https://doi.org/10.1063/1.3553208
Abstract
This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT. (C) 2011 American Institute of Physics. [doi:10.1063/1.3553208]This publication has 35 references indexed in Scilit:
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