X-Ray photoelectron spectroscopy reference data for identification of the C3N4 phase in carbon–nitrogen films
- 30 November 2000
- journal article
- research article
- Published by Elsevier BV in Diamond and Related Materials
- Vol. 9 (11), 1904-1907
- https://doi.org/10.1016/s0925-9635(00)00345-9
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Carbon nitride deposited using energetic species: A review on XPS studiesPhysical Review B, 1998
- X-ray photoelectron spectroscopy of carbon nitride films deposited by graphite laser ablation in a nitrogen postdischargeApplied Physics Letters, 1996
- Carbon Nitride Deposited Using Energetic Species: A Two-Phase SystemPhysical Review Letters, 1994
- Formation of Carbon Nitride Films by Means of Ion Assisted Dynamic Mixing (IVD) MethodJapanese Journal of Applied Physics, 1993
- Relationship between the structural organization and the physical properties of PECVD nitrogenated carbonsJournal of Materials Research, 1993
- Structural studies of poly(p-phenyleneamine) and its oxidationMacromolecules, 1990
- Prediction of New Low Compressibility SolidsScience, 1989
- X-ray photoelectron spectroscopy studies of the chemical structure of polyanilinePhysical Review B, 1989
- X-ray photoemission studies of diamond, graphite, and glassy carbon valence bandsPhysical Review B, 1974
- Molecular Spectroscopy by Means of ESCA III.Carbon compoundsPhysica Scripta, 1970