Periodic oscillations of thin film properties with their thickness for mixed real Bi2(M+N)Te3N phases
- 1 October 2005
- journal article
- Published by Elsevier BV in Surface and Coatings Technology
- Vol. 200 (1-4), 273-275
- https://doi.org/10.1016/j.surfcoat.2005.02.044
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Pulsed laser deposition of Bi2Te3 thin filmsThin Solid Films, 1996
- The thermoelectric properties and crystallography of Bi-Sb-Te-Se thin films grown by ion beam sputteringJournal of Applied Physics, 1993
- Thermoelectric cooling effect in a p-Sb2Te3−n-Bi2Te3 thin film thermocoupleSolid-State Electronics, 1992
- Properties of thin film thermoelectric materials: application to sensors using the Seebeck effectMaterials Science and Engineering B, 1992
- Transport Coefficient of Gallium‐doped Bi2Te3 Single CrystalsCrystal Research and Technology, 1991
- Transport properties of flash-evaporated (Bi1 − xSbx)2Te3 films I: Optimization of film propertiesThin Solid Films, 1990
- Structural and electrical properties of bismuth telluride films grown by the molecular beam techniqueJournal of Materials Science Letters, 1988
- Preparation and properties of co-evaporated bismuth telluride [Bi2Te3] thin filmsSolid State Communications, 1985
- Sputtered Bi2Te3 and PbTe thin filmsJournal of Vacuum Science & Technology A, 1983
- Non‐Parabolic E(k) Relation of the Lowest Conduction Band in Bi2 Te3Physica Status Solidi (b), 1976