Curve-fitting in XPS using extrinsic and intrinsic background structure
- 31 January 2000
- journal article
- Published by Elsevier BV in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 106 (1), 65-80
- https://doi.org/10.1016/s0368-2048(99)00089-4
Abstract
No abstract availableKeywords
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