Atom probe tomography
- 27 February 2009
- journal article
- other
- Published by Elsevier BV in Materials Characterization
- Vol. 60 (6), 461-469
- https://doi.org/10.1016/j.matchar.2009.02.007
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- Estimation of the Reconstruction Parameters for Atom Probe TomographyMicroscopy and Microanalysis, 2008
- Quantitative binomial distribution analyses of nanoscale like‐solute atom clustering and segregation in atom probe tomography dataMicroscopy Research and Technique, 2008
- Review of Atom Probe FIB-Based Specimen Preparation MethodsMicroscopy and Microanalysis, 2007
- New Techniques for the Analysis of Fine-Scaled Clustering Phenomena within Atom Probe Tomography (APT) DataMicroscopy and Microanalysis, 2007
- Contingency table techniques for three dimensional atom probe tomographyMicroscopy Research and Technique, 2007
- Evidence of field evaporation assisted by nonlinear optical rectification induced by ultrafast laserPhysical Review B, 2006
- Field-evaporation from first-principlesMolecular Physics, 2004
- Measurement of the Gibbsian interfacial excess of solute at an interface of arbitrary geometry using three-dimensional atom probe microscopyMaterials Science and Engineering: A, 2001
- A topological approach to materials characterisationScripta Metallurgica et Materialia, 1991
- Das FeldionenmikroskopThe European Physical Journal A, 1951