Direct measurement of refractive-index dispersion of transparent media by white-light interferometry
- 1 July 2003
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 42 (19), 3910-3914
- https://doi.org/10.1364/ao.42.003910
Abstract
We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 μm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(λ) over the whole investigated spectral range is thus obtained directly to an accuracy of 10-4 without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed.Keywords
This publication has 14 references indexed in Scilit:
- Spectroscopic interference microscopy technique for measurement of layer parametersMeasurement Science and Technology, 2001
- White-light spectral interferometry with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silicaOptics Communications, 2001
- High-precision index measurement in anisotropic crystals using white-light spectral interferometryApplied Physics B Laser and Optics, 2000
- Dispersion measurements with white-light interferometryJournal of the Optical Society of America B, 1996
- Using interference in the frequency domain for precise determination of thickness and refractive indices of normal dispersive materialsJournal of the Optical Society of America B, 1995
- Real time interferometric measurements of dispersion curvesOptics Communications, 1994
- Measurement of group delay with high temporal and spectral resolutionOptics Letters, 1990
- Group-delay measurement using the Fourier transform of an interferometric cross correlation generated by white lightOptics Letters, 1990
- Broadband cubic-phase compensation with resonant Gires–Tournois interferometersOptics Letters, 1989
- Interferometric measurements of femtosecond group delay in optical componentsOptics Letters, 1988