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Nanometer-scale recording on chalcogenide films with an atomic force microscope
Home
Publications
Nanometer-scale recording on chalcogenide films with an atomic force microscope
Nanometer-scale recording on chalcogenide films with an atomic force microscope
HK
H. Kado
H. Kado
TT
T. Tohda
T. Tohda
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29 May 1995
journal article
Published by
AIP Publishing
in
Applied Physics Letters
Vol. 66
(22)
,
2961-2962
https://doi.org/10.1063/1.114243
Abstract
No abstract available
Keywords
ATOMIC FORCE MICROSCOPE
SURFACE TOPOGRAPHY
ATOMIC FORCE MICROSCOPY
DATA STORAGE
Cited by 98 articles