Properties of a submicrometer x-ray beam at the exit of a waveguide
- 1 November 1996
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 80 (9), 4831-4836
- https://doi.org/10.1063/1.363524
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Submicrometer x-ray beam production by a thin film waveguideJournal of Applied Physics, 1996
- X-ray Fraunhofer diffraction patterns from a thin-film waveguideApplied Physics Letters, 1995
- Microdiffraction instrumentation and experiments on the microfocus beamline at the ESRFReview of Scientific Instruments, 1995
- Mode-mixing in an x-ray thin-film waveguideApplied Physics Letters, 1994
- X-ray flux enhancement in thin-film waveguides using resonant beam couplersPhysical Review Letters, 1993
- X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92Atomic Data and Nuclear Data Tables, 1993
- Resonance-Enhanced X-Rays in Thin Films: a Structure Probe for Membranes and Surface LayersScience, 1992
- Glancing-incidence x-ray fluorescence of layered materialsPhysical Review B, 1991
- Propagation of x rays in waveguidesApplied Physics Letters, 1974
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954