Holographic time-of-flight measurements of the hole-drift mobility in a photorefractive polymer

Abstract

The holographic time-of-flight (HTOF) technique is applied in a photorefractive polymer. The electric-field, temperature, and drift-length dependencies of the hole-drift mobility are shown to be consistent with previously published data. It is suggested that the shape of the HTOF signal reflects the degree of charge-transport disorder in this class of amorphous materials.