The Form of the Enriched Surface Layer in Polymer Blends
- 1 May 1990
- journal article
- Published by IOP Publishing in Europhysics Letters
- Vol. 12 (1), 41-46
- https://doi.org/10.1209/0295-5075/12/1/008
Abstract
The concentration profile at the surface in blends of deuterated and protonated polystyrene (d-PS and PS) is inferred from measurements of neutron reflectivity and secondary-ion mass spectrometry, using constraints provided by forward recoil spectrometry and X-ray reflectometry results on the same samples. The surface is enriched in d-PS, the volume fraction and the decay length of which are in good agreement with the predictions of mean-field theory but the form of the profile shows small, but statistically significant, deviations from that predicted by the theory.This publication has 12 references indexed in Scilit:
- Enrichment depth profiles in polymer blends measured by forward recoil spectrometryApplied Physics Letters, 1989
- Surface Enrichment in an Isotopic Polymer BlendPhysical Review Letters, 1989
- Surface enrichment in polymer blends — A neutron reflection testPhysica B: Condensed Matter, 1989
- Surface Enrichment in Polymer Blends: Simple Theory and an Experimental TestMRS Proceedings, 1989
- Neutron reflection investigation of the interface between an immiscible polymer pairPolymer, 1988
- Profiles of Adsorbed Polymer Layers Observed by Neutron ReflectionEurophysics Letters, 1988
- Specular reflectivity of neutrons by thin polymer filmsMacromolecules, 1988
- Polarized neutron reflectometer: A new instrument to measure magnetic depth profilesReview of Scientific Instruments, 1987
- Model calculations for wetting transitions in polymer mixturesJournal de Physique, 1985
- Surface spinodals and extended wetting in fluids and polymer solutionsThe Journal of Chemical Physics, 1983