Interatomic Forces in Scanning Tunneling Microscopy: Giant Corrugations of the Graphite Surface
- 28 July 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 57 (4), 444-447
- https://doi.org/10.1103/physrevlett.57.444
Abstract
We show that scanning tunneling microscopy (STM) images can be dominated by elastic deformations induced by atomic forces between tip and surface. New STM experiments on graphite (0001) showing a strong variation of the giant corrugation amplitudes with varying current at constant voltage are direct evidence of this atomic-force concept. Corrugations up to 8 ÅA on a lateral scale of 2.4 Å are associated with forces up to N for compression and 2 × N for expansion.
Keywords
This publication has 16 references indexed in Scilit:
- Surface Electronic Structure of Si (111)-(7×7) Resolved in Real SpacePhysical Review Letters, 1986
- Theory of Single-Atom Imaging in the Scanning Tunneling MicroscopePhysical Review Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- Tunneling microscopy of graphite in airApplied Physics Letters, 1986
- Energy-Dependent State-Density Corrugation of a Graphite Surface as Seen by Scanning Tunneling MicroscopyEurophysics Letters, 1986
- Charge-density waves observed with a tunneling microscopePhysical Review Letters, 1985
- Current distribution in the scanning vacuum tunnel microscope: a free-electron modelJournal of Physics C: Solid State Physics, 1984
- Theory and Application for the Scanning Tunneling MicroscopePhysical Review Letters, 1983
- Model Theory for Scanning Tunneling Microscopy: Application to Au(110) (1×2)Physical Review Letters, 1983
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983