Abstract
A flash x‐ray diffraction system has been constructed which permits x‐ray diffraction patterns to be recorded from shaped charge jets. The system was tested by recording an x‐ray diffraction pattern from an aluminum jet 80 μsec after charge detonation with a single pulse of 70 nsec duration. This result represents the first successful recording of an x‐ray diffraction pattern from a shaped charge jet and indicates that the system should be an important new device for determination of internal jet structure.