Depth Profiling Study of the CdTe/CdS/ITO/Glass Heterostructure with AES and GIXRD
- 10 July 2000
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 220 (1), 261-267
- https://doi.org/10.1002/1521-3951(200007)220:1<261::aid-pssb261>3.3.co;2-w