Low-temperature deformation in anthracene crystals

Abstract
The temperature dependence and the strain-rate sensitivity of the yield stress in anthracene crystals have been observed in the temperature range between 370 and 80 K in tension and/or compression tests. The yield stresses obtained showed a strong dependence on temperature at 160 K for the (001)[010] system and at 170 K for the (001)[110] system. These results are analysed in terms of thermally activated deformation and it is found that deformation is controlled by the Peierls mechanism.
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