A framework for automatic landmark identification using a new method of nonrigid correspondence
- 1 March 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Pattern Analysis and Machine Intelligence
- Vol. 22 (3), 241-251
- https://doi.org/10.1109/34.841756
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
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