Sensitivity of trigate MOSFETs to random dopant induced threshold voltage fluctuations
- 31 December 2008
- journal article
- Published by Elsevier BV in Solid-State Electronics
- Vol. 52 (12), 1872-1876
- https://doi.org/10.1016/j.sse.2008.06.061
Abstract
No abstract availableKeywords
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