Analysis of speckle images to assess surface roughness
- 1 April 2004
- journal article
- Published by Elsevier BV in Optics & Laser Technology
- Vol. 36 (3), 249-253
- https://doi.org/10.1016/j.optlastec.2003.09.005
Abstract
No abstract availableThis publication has 28 references indexed in Scilit:
- Effects of finite stylus width in surface contact profilometryApplied Optics, 1993
- Calculation Of Surface Statistics From Light ScatterOptical Engineering, 1984
- Surface Roughness Measurement with Speckle Intensity Distribution Detected Using a Linear Image-SensorJapanese Journal of Applied Physics, 1982
- Optical profilometer: a new method for high sensitivity and wide dynamic rangeApplied Optics, 1982
- Statistical properties of speckle intensity variations in the diffraction field under illumination of partially coherent lightNouvelle Revue d'Optique, 1975
- Statistical properties of speckle intensity variations in the diffraction field under illumination of coherent lightOptics Communications, 1975
- Surface Roughness Measurement by Using Speckle PatternJapanese Journal of Applied Physics, 1975
- Statistical properties of image speckle patterns in partially coherent lightNouvelle Revue d'Optique, 1975
- Effect of surface roughness on the statistical distribution of image speckle intensityOptics Communications, 1974
- II Scattering of Light by Rough SurfacesPublished by Elsevier BV ,1967