Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation
- 5 February 1999
- journal article
- Published by Elsevier BV in Acta Materialia
- Vol. 47 (3), 1053-1061
- https://doi.org/10.1016/s1359-6454(98)00366-8
Abstract
No abstract availableKeywords
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