Comparison of sensitivities in trace element analysis obtained by X-ray excited X-ray fluorescence and proton induced X-ray emission
- 15 April 1977
- journal article
- Published by Elsevier BV in Nuclear Instruments and Methods
- Vol. 142 (1-2), 333-338
- https://doi.org/10.1016/0029-554x(77)90847-3
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974