Design of ADC sinewave histogram test
- 1 October 2000
- journal article
- Published by Elsevier BV in Computer Standards & Interfaces
- Vol. 22 (4), 239-244
- https://doi.org/10.1016/s0920-5489(00)00044-1
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Histogram measurement of ADC nonlinearities using sine wavesIEEE Transactions on Instrumentation and Measurement, 1994