Characteristic Electron Energy Loss Measurements at Low Temperatures

Abstract

A method is described for the investigation of characteristic energy losses of electrons in solids at temperatures in the liquid helium and liquid hydrogen temperature range. This method had been primarily developed for the investigation of thin films of solidified permanent gases, but it is also very suitable for the study at low temperatures of any substance, which is obtainable as a thin film. For the measurement of the energy losses itself, a very versatile electrostatic analyzer lens has been constructed which allows the observation of electron diffraction patterns of the samples before and after energy loss measurements. First results are reported on thin films of solid oxygen and solid xenon.