Feasibility study for mega-electron-volt electron beam tomography
- 1 September 2012
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 83 (9), 093707
- https://doi.org/10.1063/1.4747796
Abstract
Electron beam tomography is a promising imaging modality for the study of fast technical processes. But for many technical objects of interest x rays of several hundreds of keV energy are required to achieve sufficient material penetration. In this article we report on a feasibility study for fast electron beam computed tomography with a 1 MeV electron beam. The experimental setup comprises an electrostatic accelerator with beam optics, transmission target, and a single x-ray detector. We employed an inverse fan-beam tomography approach with radiographic projections being generated from the linearly moving x-ray source. Angular projections were obtained by rotating the object.Keywords
This publication has 13 references indexed in Scilit:
- Ultrafast three-dimensional x-ray computed tomographyApplied Physics Letters, 2011
- Dual-plane ultrafast limited-angle electron beam x-ray tomographyFlow Measurement and Instrumentation, 2010
- Flow imaging by high speed transmission tomographyApplied Radiation and Isotopes, 2010
- Ultrafast cross‐sectional imaging of gas‐particle flow in a fluidized bedAIChE Journal, 2009
- Experimental two-phase flow measurement using ultra fast limited-angle-type electron beam X-ray computed tomographyExperiments in Fluids, 2009
- An ultra fast electron beam x-ray tomography scannerMeasurement Science and Technology, 2008
- Simulation study on electron beam x-ray CT arrangements for two-phase flow measurementsMeasurement Science and Technology, 2008
- Technological applications of BINP industrial electron accelerators with focused beam extracted into atmosphereRadiation Physics and Chemistry, 2000
- D.C. high power electron accelerators of ELV-series: status, development, applicationsRadiation Physics and Chemistry, 2000
- Cardiac computed tomographyProceedings of the IEEE, 1983