Full Counting Statistics of Multiple Andreev Reflection
- 28 October 2003
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 91 (18), 187002
- https://doi.org/10.1103/physrevlett.91.187002
Abstract
We derive the full counting statistics of charge transfer through a voltage biased superconducting junction. We find that, for measurement times much longer than the inverse Josephson frequency, the counting statistics describes a correlated transfer of quanta of multiple electron charges, each quantum associated with the transfer of a single quasiparticle. An expression for the counting statistics in terms of the quasiparticle scattering amplitudes is derived.This publication has 24 references indexed in Scilit:
- Stochastic Path Integral Formulation of Full Counting StatisticsPhysical Review Letters, 2003
- Full Counting Statistics of Electron Transfer between SuperconductorsPhysical Review Letters, 2001
- Counting Statistics of Photons Produced by Electronic Shot NoisePhysical Review Letters, 2001
- Shot noise in mesoscopic conductorsPhysics Reports, 2000
- The signature of chemical valence in the electrical conduction through a single-atom contactNature, 1998
- Conduction Channel Transmissions of Atomic-Size Aluminum ContactsPhysical Review Letters, 1997
- Scattering theory of superconductive tunneling in quantum junctionsLow Temperature Physics, 1997
- Electron counting statistics and coherent states of electric currentJournal of Mathematical Physics, 1996
- Subgap Structure as Function of the Barrier in Atom-Size Superconducting Tunnel JunctionsPhysical Review Letters, 1994
- Quantum shot noise in a normal-metal–superconductor point contactPhysical Review B, 1994