Rewritable phase-change optical recording in Ge2Sb2Te5 films induced by picosecond laser pulses
- 23 March 2004
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 84 (13), 2250-2252
- https://doi.org/10.1063/1.1689756
Abstract
The phase transformation dynamics induced in films by picosecond laser pulses were studied using real-time reflectivity measurements with subnanosecond resolution. Evidence was found that the thermal diffusivity of the substrate plays a crucial role in determining the ability of the films to crystallize and amorphize. A film/substrate configuration with optimized heat flow conditions for ultrafast phase cycling with picosecond laser pulses was designed and produced. In this system, we achieved reversible phase transformations with large optical contrast using single laser pulses with a duration of 30 ps within well-defined fluence windows. The amorphization (writing) process is completed within less than 1 ns, whereas crystallization (erasing) needs approximately 13 ns to be completed.
Keywords
This publication has 15 references indexed in Scilit:
- Theoretical explanation of different crystallization processes between as-deposited and melt-quenched amorphous Ge2Sb2Te5 thin filmsThin Solid Films, 2003
- Ultrashort-laser-pulse-driven rewritable phase-change optical recording in Sb-based filmsApplied Physics A, 2003
- Fluorescence lifetime system for microscopy and multiwell plate imaging with a blue picosecond diode laserOptics Letters, 2002
- Progress of the Phase-change Optical Disk MemoryMRS Proceedings, 2001
- Computer-Aided Design and Analysis of Rewritable Phase-Change Optical DiskJapanese Journal of Applied Physics, 2000
- Real-time optical measurements with picosecond resolution during laser induced transformationsReview of Scientific Instruments, 2000
- High Performance Media for Phase Change Optical RecordingJapanese Journal of Applied Physics, 1999
- Phase Change Cycling for Erasable Optical Storage Driven by Ultrashort Laser PulsesJapanese Journal of Applied Physics, 1997
- A Simple, Analytical and Complete Deep-Submicrometer Fully Depleted Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect-Transistor Model Considering Velocity OvershootJapanese Journal of Applied Physics, 1997
- Completely Erasable Phase Change Optical DiskJapanese Journal of Applied Physics, 1992