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Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage
Home
Publications
Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage
Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage
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D. C. Bossen
D. C. Bossen
MH
M. Y. Hsiao
M. Y. Hsiao
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1 January 1982
journal article
Published by
IBM
in
IBM Journal of Research and Development
Vol. 26
(1)
,
67-77
https://doi.org/10.1147/rd.261.0067
Abstract
No abstract available
Cited by 25 articles