Application of the Rietveld method to the severely superimposed diffraction patterns of technical products containing a large number of solid solution phases
- 1 June 2006
- journal article
- website
- Published by Walter de Gruyter GmbH in Zeitschrift für Kristallographie Supplements
- Vol. 2006 (suppl_23_2), 29-34
- https://doi.org/10.1524/zksu.2006.suppl_23.29
Abstract
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This publication has 1 reference indexed in Scilit:
- A fundamental parameters approach to X-ray line-profile fittingJournal of Applied Crystallography, 1992