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Chip detectives [reverse engineering]
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Chip detectives [reverse engineering]
Chip detectives [reverse engineering]
JK
J. Kumagai
J. Kumagai
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1 November 2000
journal article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
in
IEEE Spectrum
Vol. 37
(11)
,
43-48
https://doi.org/10.1109/6.880953
Abstract
No abstract available
Keywords
SEMICONDUCTOR MANUFACTURING
CHIP
SCANNING ELECTRON MICROSCOPY
X RAY DETECTORS
REVERSE ENGINEERING
INTELLECTUAL PROPERTY
INNOVATION
Cited by 34 articles