Infrared Lattice Vibrations and Free-Electron Dispersion in GaN

Abstract
Infrared reflectivity and absorption measurements have been made on single-crystal epitaxial GaN on (0001) α Al2 O3 crystals. Analysis of the normal-incidence reflectance data on low-carrier-concentration layers using the Kramers-Kronig technique and dielectric oscillator fits yields the values ωTO=560 cm1 and ωLO=746 cm1 for the optical mode frequencies at 300 K. Adopting ε=5.35 from a fit to Ejder's refractive-index data the additional quantities εo=9.5 for the static dielectric constant, eB*=2.65e for the Born effective charge, and α=0.44 for the polaron coupling constant are derived. Reflectivity measurements at 50° incidence with s and p polarizations show that the longitudinal lattice mode is nearly isotropic. Using the value ωTO=533 cm1 from Raman data the values ωLO=744 cm1, εo=10.4, eB*=2.82e, and α=0.49 are obtained from oscillator fits to the 50° incidence data. Information on the free-carrier effects in GaN was obtained by studying the normal-incidence reflectance as a function of carrier concentration in the 2×1017 to 1×1020 cm3 range. By fitting the reflectance minima versus concentration data, a value of m*m=(0.20±0.02) for the optical effective mass is obtained. Measurements at 50° incidence show that the plasma frequency is isotropic within experimental precision.

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