Experimental Study Of Threshold Voltage Fluctuations Using An 8k MOSFET's Array
- 1 January 1993
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Effects of microscopic fluctuations in dopant distributions on MOSFET threshold voltageIEEE Transactions on Electron Devices, 1992
- A 45-ns 16-Mbit DRAM with triple-well structureIEEE Journal of Solid-State Circuits, 1989
- Physical limits in digital electronicsProceedings of the IEEE, 1975