New measurement system for fault location in optical waveguide devices based on an interferometric technique
- 1 May 1987
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 26 (9), 1603-1606
- https://doi.org/10.1364/ao.26.001603
Abstract
A new measurement system for fault location in optical waveguide devices is presented. The system consists of a fiber-optic Mach-Zehnder and a bulk-type Michelson interferometers. The spatial resolution of the scatter distribution is μm, which is limited by the averaging time. The minimum detectable backscattered power is −116 dB relative to the light power propagating in the waveguides. Preliminary experimental results using single-mode fibers <10 cm long are demonstrated.Keywords
This publication has 10 references indexed in Scilit:
- Measurement of spatial distribution of mode coupling in birefringent polarization-maintaining fiber with new detection schemeOptics Letters, 1986
- Low-loss high-silica single-mode channel waveguidesElectronics Letters, 1986
- Polarisation-maintaining fibre couplers with low excess lossElectronics Letters, 1986
- OFDR diagnostics for fibre and integrated-optic systemsElectronics Letters, 1985
- High-power low-divergence superradiance diodeApplied Physics Letters, 1982
- Backscattering in single-mode fibresElectronics Letters, 1980
- Photon Probe-An Optical-Fiber Time-Domain ReflectometerBell System Technical Journal, 1977
- Fiber waveguides: a novel technique for investigating attenuation characteristicsApplied Optics, 1976
- Spectral losses of low-OH-content optical fibresElectronics Letters, 1976
- Optical waveguiding layers in LiNbO3 and LiTaO3Applied Physics Letters, 1973