Sub-micrometer thermal physics – An overview on SThM techniques
- 27 February 1998
- journal article
- Published by Elsevier BV in Thermochimica Acta
- Vol. 310 (1-2), 1-17
- https://doi.org/10.1016/s0040-6031(97)00379-1
Abstract
No abstract availableThis publication has 52 references indexed in Scilit:
- Thermal resistance of silicon point contactsPhysical Review B, 1989
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Scanning capacitance microscopyJournal of Physics E: Scientific Instruments, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Ballistic charge-carrier transport in semiconductor point contactsPhysical Review B, 1987
- Scanning thermal profilerApplied Physics Letters, 1986
- Quenched Phonon Drag in Silicon MicrocontactsPhysical Review Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- Fundamentals of Low Dimensional PhysicsSpringer Proceedings in Physics, 1986
- Asymmetric Joule heat production at a point contactApplied Physics A, 1984