Technical Guidelines for Reliable Measurements of the Quantized Hall Resistance
- 1 January 1989
- journal article
- Published by IOP Publishing in Metrologia
- Vol. 26 (1), 63-68
- https://doi.org/10.1088/0026-1394/26/1/005
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Two-terminal resistance of quantum Hall devicesPhysical Review B, 1988
- Quantum Hall effect in silicon metal-oxide-semiconductor inversion layers: Experimental conditions for determination of h/Physical Review B, 1986
- Precise Quantized Hall Resistance Measurements in GaAs/AlxGa1-xAs and InxGa1-xAs/InP HeterostructuresMetrologia, 1986
- Temperature dependence of the quantum Hall resistancePhysical Review B, 1984
- Hall voltage dependence on inversion-layer geometry in the quantum Hall-effect regimePhysical Review B, 1981