Artificial DNA nanostructure detection using solution-processed In-Ga-Zn-O thin-film transistors
- 5 March 2012
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 100 (10), 103702
- https://doi.org/10.1063/1.3692587
Abstract
A method for detecting artificial DNA using solution-processed In-Ga-Zn-O (IGZO) thin-film transistors (TFTs) was developed. The IGZO TFT had a field-effect mobility (μFET) of 0.07 cm2/Vs and an on-current (Ion) value of about 2.68 μA. A dry-wet method was employed to immobilize double-crossover (DX) DNA onto the IGZO surface. After DX DNA immobilization, significant decreases in μFET (0.02 cm2/Vs) and Ion (0.247 μA) and a positive shift of threshold voltage were observed. These results were attributed to the negatively charged phosphate groups on the DNA backbone, which generated electrostatic interactions in the TFT device.Keywords
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