Dynamic data-bit memory built-in self-repair

Abstract

In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits of the technology they are more prone to failures than logic. Thus, they concentrate the large majority of defects and affect circuit yield dramatically. Thus, Built-In Self-Repair is gaining significant importance. This work presents a dynamic memory built-in self-repair schemer acting on the data-bit level. It allows reducing the size of the repairable units, or in other words, it allows using a single spare unit for repairing faults affecting several regular units. As a consequence, it repairs multiple faults by means of low hardware cost.