Density and refractive index of TiO2 films prepared by reactive evaporation
- 1 August 2000
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 371 (1-2), 218-224
- https://doi.org/10.1016/s0040-6090(00)01015-4
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Correlation between the density of TiO2 films and their propertiesThin Solid Films, 1996
- Density of thin TiO2 filmsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1996
- Nucleation and growth in TiO2 films prepared by sputtering and evaporationThin Solid Films, 1994
- Study of the Lorentz-Lorenz law and the energy loss of 4He ions in titanium oxide filmsThin Solid Films, 1994
- Determination of the optical constants (n, k) of thin dielectric filmsApplied Optics, 1993
- Recent developments of laser optical coatings in HungaryOptical Engineering, 1993
- Comparison of the properties of titanium dioxide films prepared by various techniquesApplied Optics, 1989
- Determination of the thickness and optical constants of amorphous siliconJournal of Physics E: Scientific Instruments, 1983
- Refractive indices of TiO_2 films produced by reactive evaporation of various titanium–oxygen phasesApplied Optics, 1976
- The optical properties of thin films of tantalum pentoxide and zirconium dioxideThin Solid Films, 1975