Microstructure characterization of transition films from amorphous to nanocrocrystalline silicon
- 31 August 2003
- journal article
- Published by Elsevier BV in Journal of Crystal Growth
- Vol. 256 (1-2), 27-32
- https://doi.org/10.1016/s0022-0248(03)01342-3
Abstract
No abstract availableKeywords
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