Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy
- 15 January 2020
- journal article
- research article
- Published by Wiley in Advanced Electronic Materials
- Vol. 6 (2), 1901171
- https://doi.org/10.1002/aelm.201901171
Abstract
No abstract availableKeywords
Funding Information
- Horizon 2020 Framework Programme (720827)
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