Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS
- 1 June 2010
- journal article
- Published by Elsevier BV in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 268 (11-12), 1714-1717
- https://doi.org/10.1016/j.nimb.2010.02.045
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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