Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance
- 1 May 1991
- journal article
- Published by Elsevier BV in Optics Communications
- Vol. 82 (5-6), 425-432
- https://doi.org/10.1016/0030-4018(91)90353-f
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experimentApplied Optics, 1990
- Adsorption of proteins on metal surfaces studied by ellipsometric and capacitance measurementsColloids and Surfaces, 1985
- Surface plasmon resonance and immunosensorsElectronics Letters, 1984
- Surface plasmon resonance for gas detection and biosensingSensors and Actuators, 1983
- Die Bestimmung optischer Konstanten von Metallen durch Anregung von OberflächenplasmaschwingungenThe European Physical Journal A, 1971