Lock-in contact thermography investigation of lateral electronic inhomogeneities in semiconductor devices
- 1 November 1998
- journal article
- Published by Elsevier BV in Sensors and Actuators A: Physical
- Vol. 71 (1-2), 46-50
- https://doi.org/10.1016/s0924-4247(98)00170-8
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Evaluation of Local Electrical Parameters of Solar Cells by Dynamic (Lock-In) Thermographyphysica status solidi (a), 1997
- The origin of defects in SiO2 thermally grown on Czochralski silicon substratesJournal of Applied Physics, 1995
- Thermal wave imaging with phase sensitive modulated thermographyJournal of Applied Physics, 1992