Reliability of III–V devices – The defects that cause the trouble
- 13 April 2011
- journal article
- Published by Elsevier BV in Microelectronic Engineering
- Vol. 90, 3-8
- https://doi.org/10.1016/j.mee.2011.04.019
Abstract
No abstract availableKeywords
Funding Information
- ONR MURI (N-00014-08-100655)
- McMinn Endowment
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