Effects of Additions to SnO2 Thin Films

Abstract
The effects of adding Sb and In to pyrolytic films were investigated. The large rise in resistivity for larger additions of Sb was studied using x‐ray diffraction, effects of heat‐treatment, determination of activation energy, and scanning electron microscopy. These results indicate that the rise is caused by a gradual loss of crystallinity and demonstrated the important effects of thermal history on the films' structure and electrical characteristics.