Time-Resolved Reflectivity Measurements of Femtosecond-Optical-Pulse-Induced Phase Transitions in Silicon
- 7 February 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 50 (6), 454-457
- https://doi.org/10.1103/physrevlett.50.454
Abstract
The reflectivity of silicon has been measured following excitation with intense 90-fsec optical pulses. These measurements for the first time clearly resolve in time the process of energy transfer to the crystal lattice and the dynamics of the phase transition to the melted state.Keywords
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