Analysis of Raman spectra of amorphous-nanocrystalline silicon films
- 1 August 2004
- journal article
- Published by Pleiades Publishing Ltd in Physics of the Solid State
- Vol. 46 (8), 1528-1532
- https://doi.org/10.1134/1.1788789
Abstract
A new method is proposed for the treatment of Raman spectra of amorphous-nanocrystalline silicon films serving as a major component in solar cells. The method is based on the well-known theory of strong spatial localization (confinement) of phonons and offers the possibility of estimating the fractional content of the amorphous and crystalline phases in a film and the size distribution of nanocrystals.Keywords
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