Low-frequency charge noise in suspended aluminum single-electron transistors
- 16 July 2007
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 91 (3)
- https://doi.org/10.1063/1.2759260
Abstract
The authors have developed a fabrication method for suspended metallic single-electron transistors (SETs) utilizing a combination of conventional angle evaporation technique and ashing of the underlying organic polymer. The authors’ Al-based suspended devices exhibit clear Coulomb blockade effects typical for conventional SETs. The measured low-frequency charge noise is rather low but still within the range reported for conventional Al devices. We suggest that the noise level can be further reduced by decreasing the effective SET temperature.Keywords
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