Optical Properties of CdS Microcrystallite-Doped SiO2 Glass Thin Films

Abstract
The optical properties of SiO2 glass thin films containing CdS microcrystallites have been investigated. The thin films were deposited onto SiO2 and GaAs substrates using an rf-sputtering technique. X-ray photoelectron spectroscopy and X-ray diffraction measurement indicated that the Cd and S atoms were doped as CdS with a hexagonal system in SiO2 glass matrixes. In the optical absorption spectra, the absorption edge of the films with 18.5 at% of CdS clearly exhibited a blue shift by about 0.13 eV in comparison with that of the bulk CdS. In accordance with this result, the photoluminescence spectra of the films exhibited a blue band-edge emission at a higher energy than that of the bulk CdS. The shift to higher energy seems to be a low-dimensional quantum size effect due to confinement of electrons and holes in CdS microcrystallites.