Pulsed Laser Ablation for Tin Dioxide: Nucleation, Growth, and Microstructures
- 6 November 2008
- journal article
- research article
- Published by Informa UK Limited in Critical Reviews in Solid State and Materials Sciences
- Vol. 33 (3-4), 197-209
- https://doi.org/10.1080/10408430802415006
Abstract
Pulsed-laser ablation approaches are being developed for the growth of oxide thin films as versatile platform for advanced applications. Semiconducting SnO 2 thin film is of fundamental importance in the advancement of microdevices. In this review, SnO 2 thin films of various microstructures have been made using the pulsed-laser deposition method. The microstructural aspects include tetragonal, porous, and orthorhombic structure characteristics. The quantum-dots and dynamic simulations of SnO 2 nanocrystals have blossomed into a submonolayer regime devoted to the nucleation and growth for these functional films. SnO 2 thin films with some of the microstructural features may have great implications for the development of novel prototype gas sensors and transparent conduction electrodes.Keywords
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