Optical properties of SiC investigated by spectroscopic ellipsometry from 3.5 to 10 eV
- 1 March 2000
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 364 (1-2), 111-113
- https://doi.org/10.1016/s0040-6090(99)00893-7
Abstract
No abstract availableKeywords
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