MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE
- 4 August 2005
- journal article
- Published by Annual Reviews in Annual Review of Materials Research
- Vol. 35 (1), 539-569
- https://doi.org/10.1146/annurev.matsci.35.102103.090513
Abstract
▪ Abstract In the nanoscience era, the properties of many exciting new materials and devices will depend on the details of their composition down to the level of single atoms. Thus the characterization of the structure and electronic properties of matter at the atomic scale is becoming ever more vital for economic and technological as well as for scientific reasons. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) represents a powerful method to link the atomic and electronic structure to macroscopic properties, allowing materials, nanoscale systems, and interfaces to be probed in unprecedented detail. Z-contrast STEM uses electrons that have been scattered to large angles for imaging. The relative intensity of each atomic column is roughly proportional to Z2, where Z is the atomic number. Recent developments in correcting the aberrations of the lenses in the electron microscope have pushed the achievable spatial resolution and the sensitivity for imaging and spectroscopy in the STEM into the sub-Ångstrom (sub-Å) regime, providing a new level of insight into the structure/property relations of complex materials. Images acquired with an aberration-corrected instrument show greatly improved contrast. The signal-to-noise ratio is sufficiently high to allow sensitivity even to single atoms in both imaging and spectroscopy. This is a key achievement because the detection and measurement of the response of individual atoms has become a challenging issue to provide new insight into many fields, such as catalysis, ceramic materials, complex oxide interfaces, or grain boundaries. In this article, the state-of-the-art for the characterization of all of these different types of materials by means of aberration-corrected STEM and EELS are reviewed.Keywords
This publication has 101 references indexed in Scilit:
- Letter to the Editor: Limitations to the Measurement of Oxygen Concentrations by HRTEM Imposed by Surface RoughnessMicroscopy and Microanalysis, 2005
- Origin of Anomalous Pt–Pt Distances in the Pt/Alumina Catalytic SystemChemphyschem, 2004
- Mapping of Process-Induced Dopant Redistributions by Electron HolographyMicroscopy and Microanalysis, 2004
- Atomic Structure of aReconstructedInterfacePhysical Review Letters, 2004
- Nanoscale analysis of YBa2Cu3O7−x/La0.67Ca0.33MnO3 interfacesSolid-State Electronics, 2003
- Electroceramic materialsActa Materialia, 2000
- Mixed-valence manganitesAdvances in Physics, 1999
- Symmetrized partial-wave method for density-functional cluster calculationsPhysical Review B, 1994
- Surface area stability and characterisation of a novel sulfate-based alumina modified by rare earth and alkaline earth ionsApplied Catalysis A: General, 1994
- Über einige Fehler von ElektronenlinsenThe European Physical Journal A, 1936